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GaN Systems presenting products and strategies at APEC

by Semiconductor News | Mar 10, 2023 | Semiconductor News

News: Microelectronics 10 March 2023 In booth #822 at the 38th annual Applied Power Electronics Conference (APEC 2023) in Orlando, FL, USA (19–23 March), GaN Systems Inc of Ottawa, Ontario, Canada (a fabless developer of gallium nitride-based power switching...

Keysight introduces new method to accelerate power amplifier digital pre-distortion test speeds

by Semiconductor News | Mar 10, 2023 | Semiconductor News

News: Suppliers 10 March 2023 Keysight Technologies Inc of Santa Rosa, CA, USA has introduced the new Iterative Learning Control (ILC) test method that significantly shortens digital pre-distortion (DPD) test times for power amplifiers. As a core component in wireless...

CSconnected welcomes UK Government Science & Technology Framework, but environment needed for exploitation and commercialization of innovations

by Semiconductor News | Mar 9, 2023 | Semiconductor News

News: Suppliers 9 March 2023 The UK Government’s newly created Department for Science, Innovation & Technology (DSIT) has published its new Science and Technology framework that clearly identifies semiconductors and quantum technologies as two of the five...

Avicena partners with ams OSRAM on production of ultra-low-energy chip-to-chip optical interconnects

by Semiconductor News | Mar 8, 2023 | Semiconductor News

News: LEDs 8 March 2023 Avicena Tech Corp of Sunnyvale, CA, USA (which develops ultra-low-energy optical links based on micro-LEDs) has partnered with ams OSRAM GmbH of Premstaetten/Graz, Austria and Munich, Germany to develop high-volume manufacturing of gallium...

NI acquires SET to accelerate power semi and aerospace/defense test system development

by Semiconductor News | Mar 7, 2023 | Semiconductor News

News: Suppliers 7 March 2023 Automated test & measurement system firm NI of Austin, TX, USA has acquired SET GmbH of Wangen, Germany, which develops aerospace & defense test systems as well as power semiconductor reliability test. Founded in 2001, SET has...
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